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dc.contributor.authorMert, Ahmet
dc.contributor.authorAkkurt, Nihan
dc.contributor.authorAkan, Aydın
dc.date.accessioned2021-06-05T19:57:05Z
dc.date.available2021-06-05T19:57:05Z
dc.date.issued2014
dc.identifier.isbn978-1-4799-4874-1
dc.identifier.issn2165-0608
dc.identifier.urihttps://hdl.handle.net/20.500.12960/433
dc.description0000-0003-4236-3646en_US
dc.description0000-0001-8894-5794en_US
dc.descriptionWOS:000356351400115en_US
dc.description.abstractIn this study, a method is presented for the removal of electrooculogram (EOG) noise from electroencephalography (EEG) recordings by using recently proposed data driven approach called Empirical Mode Decomposition (EMD). The EMD represents the signal as a combination of Intrinsic Mode Functions (IMFs). It is an important problem to determine which IMFs belong to signal and noise in multi-component or noisy signals. Detrended Fluctuation Analysis (DFA) is a successful method to characterize non-stationary signals. In our approach, a threshold is determined from the DFA, and used to select the noise IMEs. Performance of the proposed method is demonstrated by means of computer simulations using noisy EEG signals.en_US
dc.description.sponsorshipIEEE, Karadeniz Tech Univ, Dept Comp Engn & Elect & Elect Engnen_US
dc.language.isoturen_US
dc.publisherIEEEen_US
dc.relation.ispartof2014 22Nd Signal Processing and Communications Applications Conference (Siu)en_US
dc.relation.ispartof22nd IEEE Signal Processing and Communications Applications Conference (SIU) -- APR 23-25, 2014 -- Karadeniz Teknik Univ, Trabzon, TURKEYen_US
dc.relation.ispartofseriesSignal Processing and Communications Applications Conference
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectEmpirical Mode Decompositionen_US
dc.subjectDetrended Fluctuation Analysisen_US
dc.subjectElectroencephalogramen_US
dc.subjectElectrooculogramen_US
dc.subjectDenoisingen_US
dc.titleEOG denoising using empirical mode decomposition and detrended fluctuation analysisen_US
dc.typeconferenceObjecten_US
dc.departmentMühendislik Fakültesi, Elektrik-Elektronik Mühendisliği Bölümüen_US
dc.department-temp[Mert, Ahmet] Piri Reis Univ, Makina Muhendisligi Bolumu, Tuzla Istanbul, Turkey; [Akkurt, Nihan; Akan, Aydin] Istanbul Univ, Biyomed Muhendisligi Anabilim Dali, Istanbul, Turkeyen_US
dc.contributor.institutionauthorMert, Ahmet
dc.identifier.doi10.1109/SIU.2014.6830286
dc.identifier.startpage544en_US
dc.identifier.endpage547en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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